X-Ray Diffraction Laboratory
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Full quantitative analyses

The quality of our analyses is determined by:
  • the use of TOPAS software, engaged by NIST to approve various standards

  • statistical base of TOPAS: calculations of wt.%, unit cell parameters, etc., are provided with values like Rwp (residual weighted-pattern), GoF (Goodness of Fit, i.e. χ2), DW / dDW (Durbin-Watson statistics), or standard deviation

  • independent callibration of the diffractometer by various geometry settings with the use of NIST standards (LaB6, Si) and own standards (mixtures like quartz-muscovite-kaolinite)

Up-to-now obtained results show that our methodology is also useful for clayey samples.

Presentation - examples of quantitative analyses »»

    Standards for quantitative analysis